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SUMMARY:Boundary Scan. From Connection Testing to On-silicon Toolkits - Ma
 tt Lee\, XJTAG
DTSTART:20080403T180000Z
DTEND:20080403T193000Z
UID:TALK10980@talks.cam.ac.uk
CONTACT:Ian Stevens
DESCRIPTION:Boundary scan based on the JTAG 1149.1 IEEE standard has been 
 around a long time - so have test engineers. Following the usual pressures
  to shrink\, further integrate and 'make re-programmable' new designs\; we
  are now seeing a renewed interest in test using JTAG.\n\nXJTAG\, Matt Lee
 's company\, has added a suite of test tools on top of the 1149.1 standard
 . These are based around a high-level language\, XJEASE. It is this 'langu
 age' which has proved invaluable for reasons you probably will not guess. 
 This talk will explain how JTAG Boundary Scan works and you'll see some ex
 amples of it in action from its basic use to advanced on-silicon diagnosis
 .\n\n
LOCATION:Lecture Theatre 1\, Cambridge University Computer Laboratory\, J 
 J Thompson Avenue\, Madingley Road\, Cambridge
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