BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Talks.cam//talks.cam.ac.uk//
X-WR-CALNAME:Talks.cam
BEGIN:VEVENT
SUMMARY:Nanoscale Patterning and Imaging -  Dr Taylor Stock\,  London Cent
 re for Nanotechnology.  Dr Colm Durkan\, Nanoscience Centre\, University o
 f Cambridge 
DTSTART:20181115T190000Z
DTEND:20181115T203000Z
UID:TALK114727@talks.cam.ac.uk
CONTACT:James Macdonald
DESCRIPTION:Our final event this year will be held in the Nihon room at Pe
 mbroke college on 15th November. Refreshments will be available from 7pm a
 nd talks will start at 7.30pm. \n\nWe are excited to be hosting two great 
 speakers and hope to see you there!\n\n\nDr Taylor Stock\, \nLondon Centre
  for Nanotechnology\n\nAtomically Precise Dopant Nanostructures in Silicon
 : Fabrication and Characterisation\nAtomically precise placement of indivi
 dual dopant atoms within a semiconductor crystal lattice represents the ul
 timate miniaturization of electronic device fabrication. This high precisi
 on control of matter has been achieved\, and is currently only accessible 
 using scanning tunneling microscopy hydrogen desorption lithography (STM-H
 DL). Over the past two and a half decades\, STM-HDL has been developed to 
 the degree that structures such as a single atom single electron transisto
 r can be successfully fabricated. Atomically precise device fabrication op
 ens a door to the realization of revolutionary new quantum devices\, by al
 lowing spatial confinement in all three dimensions\, and ultimately\, the 
 isolation of individual charges and spins. Further development of this tec
 hnique aims to increase yield and scale\, expand the materials palette\, a
 nd implement advanced characterisation strategies for rapid throughput and
  quality control. In this talk\, I describe the basic science and technolo
 gy of STM-HDL for atomic scale device fabrication\, and share some recent 
 advances from our research group aimed at introducing additional dopant sp
 ecies\, and developing existing and novel characterisation techniques for 
 analysis of dopant nanostructures.\n\nDr Colm Durkan\, Nanoscience Centre\
 , University of Cambridge \nNanomechanical Atomic Force Microscopy\n\nOil-
 exposed surfaces are susceptible to carbonaceous deposits (CDs). In turn\,
  deposits are responsible for fouling\, compromising performance and reduc
 ing profitability across the hydrocarbon value chain. An understanding of 
 the deposition behaviour of these organic molecules is imperative in order
  to tackle this problem. In particular\, we will address the question of u
 nderstanding the deposition in upstream operation\, where the CDs are know
 n to be asphaltenes\, the heaviest fraction of oil. Systematic characteris
 ation of fouled oil-exposed surfaces constitutes an initial step towards t
 hat direction and it is a challenging task in itself. The merits and disad
 vantages of using Atomic Force Microscopy (AFM) as the characterisation te
 chnique of choice are presented\, the methodology followed is discussed an
 d relevant results showing the effect of an adhesion inhibitor (AI) on dep
 osition are exhibited. This work provides insights towards an understandin
 g of the deposition behaviour of asphaltenes and encourages the use of the
  nanomechanical imaging capabilities of the AFM for their characterisation
 .\n\n\n\n
LOCATION:Nihon Room\, Pembroke College
END:VEVENT
END:VCALENDAR