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SUMMARY:Advanced Electron Microscopy for Nanomaterials - Dr Ilke Arslan\, 
 Sandia National Laboratories\, USA
DTSTART:20080714T140000Z
DTEND:20080714T150000Z
UID:TALK12889@talks.cam.ac.uk
CONTACT:Dr Jonathan Barnard
DESCRIPTION:Nanomaterials pose ever-increasing challenges for characteriza
 tion with their small dimensions\, three-dimensional shapes\, demanding in
 ternal structures\, and novel electronic properties.  The field of electro
 n microscopy has enjoyed many outstanding advances which allow for the det
 ailed understanding of complex nanomaterials\, such as aberration-correcti
 on\, monochromation for EELS\, three-dimensional imaging for inorganic mat
 erials\, in-situ microscopy\, and atom-probe tomography.  In this talk I w
 ill review our recent results using a combination of some of these techniq
 ues to solve materials problems for a variety of nanomaterials with applic
 ations ranging from optoelectronics to energy storage.  
LOCATION:Austin Lecture Theatre\, Materials Science and Metallurgy\, Depar
 tment of
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