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SUMMARY:The formation of contrast in scanning helium microscopy - Sam Lamb
 rick\, Surface Physics\, Cavendish Laboratory
DTSTART:20230223T150000Z
DTEND:20230223T160000Z
UID:TALK193789@talks.cam.ac.uk
CONTACT:Stephen Walley
DESCRIPTION:Over the last decade a new microscopy technique has emerged th
 at uses neutral helium atoms as the probe particles. It has been termed sc
 anning helium microscopy (SHeM)\, also known as neutral atom microscopy (N
 AM). SHeM produces helium atom micrographs by scanning the sample beneath 
 a focused or collimated helium microprobe. As the technique is maturing\, 
 research efforts are moving on from the development of proof of concept in
 struments to the exploring of applications and optimising designs for the 
 second generation of machine. In particular the mechanisms of contrast for
 mation in SHeM are an active area of investigation.\n\nJoin on your comput
 er\, mobile app or room device\n"Click here to join the talk online":https
 ://teams.microsoft.com/l/meetup-join/19%3ameeting_OWY1ZjY1MTgtN2VjMC00OWFj
 LTljNWUtYjg2NDgwZTA1NmU0%40thread.v2/0?context=%7b%22Tid%22%3a%2249a50445-
 bdfa-4b79-ade3-547b4f3986e9%22%2c%22Oid%22%3a%227c6a2f02-88b3-4342-87da-b6
 2dd7126ff0%22%7d\nMeeting ID: 397 072 953 845 \nPasscode: 4FY5i8
LOCATION:Mott Seminar Room\, Cavendish Laboratory
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