BEGIN:VCALENDAR VERSION:2.0 PRODID:-//Talks.cam//talks.cam.ac.uk// X-WR-CALNAME:Talks.cam BEGIN:VEVENT SUMMARY:Surface analysis – elemental identification &\; quantificatio n – challenges and opportunities - Dr Babak Bakhit\, University of Cambridge DTSTART:20230927T130000Z DTEND:20230927T140000Z UID:TALK205084@talks.cam.ac.uk CONTACT:Dr Mark Leadbeater DESCRIPTION:Abstract:\n\nIn addition to nanostructure\, the propert ies (from mechanical to electrical and chemical) of functional materials d irectly depend on their chemistry as well as elemental (and impurity) comp ositions and distributions. Thus\, a precise compositional analysis is ess ential for proper research. However\, achieving accurate elemental identif ication and quantification by most conventional analytical techniques is t ypically challenging\, in particular\, for materials containing light elem ents or multicomponents with close atomic numbers. several analytical meth ods are available\, including chemistry- and physics-based techniques. Che mistry-based analytical techniques such as potentiometric titrations\, pol arimetry\, spectrophotometry\, ion chromatography\, gas chromatography\, a nd inductively coupled plasma mass spectrometry are time-consuming\, highl y prone to interferences\, and require derivatisation\, complex analytical procedures\, and several dilutions of samples. More popular are the physi cs-based techniques such as energy-dispersive X-ray spectroscopy (EDX)\, X -ray photoelectron spectroscopy (XPS)\, and ion beam analysis (IBA) techni ques that are fast and more user friendly. In this talk\, I will firstly f ocus on widely-used XPS and highlight its strengths and most importantly c hallenges\, which cause systematic errors in unfortunately more than 30% o f peer-reviewed publications. Then\, advanced non-destructive analytical t echniques that can detect all elements will be introduced\, and finally\, I will propose the best practice for accurately determining the chemical c ompositions of a broad range of complex materials\, especially functional oxides.\n\nBiography:\n\nBabak holds a PhD in Thin Film Physics at the Physics Department of Linköping University in Sweden and is currently a postdoc in Thin Film Electronics at Electrical Engineering Division\, i n Cambridge. His research focuses on the growth of various thin films with complex nanostructures by magnetron sputtering and in particular HiPIMS f or energy efficient memory and data storage applications. He also works wi th characterization tools such as XPS\, ion beam analysis techniques (ERDA \, RBS\, and PIXE)\, TEM\, FIB\, AFM\, X-rays techniques\, and in-situ ion mass spectrometry. Babak has been involved in several projects dealing wi th thin films in collaboration with partners from both academia and indust ry. Perhaps\, his most important industry collaboration was in JUICE proje ct with European Space Agency that he successfully sputter-deposited thin films on large spheres\, which are parts of Langmuir probes for exploring atmosphere around Jupiter icy moons.\n\nRegistration\n\nFor online participation register at: https://cam-ac-uk.zoom.us/j/83201949436 \n LOCATION:Electrical Engineering Seminar Room and Online (registration requ ired) END:VEVENT END:VCALENDAR