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SUMMARY:Advancing Microstructural Characterization with EBSD and TKD – n
 ew algorithms\, more dimensions\, and new detectors - Dr Ben Britton\, Uni
 versity of British Columbia
DTSTART:20231109T140000Z
DTEND:20231109T150000Z
UID:TALK208261@talks.cam.ac.uk
CONTACT:David Wallis
DESCRIPTION:Electron backscatter diffraction (EBSD) is a powerful techniqu
 e that enables us to probe the structure of crystalline materials within t
 he scanning electron microscope (SEM). Transmission Kikuchi diffraction (T
 KD) adapts this technique to look at thin lamella in the SEM and improves 
 the spatial resolution significantly. In this talk\, I will introduce some
  correlative approaches to improve our use of EBSD to analyse precipitates
  in Ni-based superalloys and guide alloy-design using machine learning alg
 orithms & pattern matching\, as well as correlative approaches with simult
 aneous energy dispersive X-ray spectroscopy (EDS/EDX). To advance these te
 chniques even further\, I will discuss recent work capturing TKD and EBSD 
 patterns with direct electron detectors (DEDs) based upon the Timepix arch
 itectures. Finally\, I will introduce some 3D plasma focussed ion beam (pF
 IB) EBSD tomography of deformation under indents in magnesium\, which we a
 re using to understand anisotropic plastic deformation mechanisms in light
 weight alloys.
LOCATION:Goldsmiths 2\, Lecture room\, Dept. of Materials Science and Meta
 llurgy
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