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SUMMARY:Fault-Tolerant System-on-Chip Design for Harsh Space Environments 
 - Mohamed Mounir\, ESA (European Space Agency)
DTSTART:20250923T090000Z
DTEND:20250923T093000Z
UID:TALK234826@talks.cam.ac.uk
CONTACT:Prof Simon Moore
DESCRIPTION:Reliability is crucial for ensuring safe operation and optimiz
 ing efficiency in safety-critical applications. Fault-tolerant integrated 
 circuits are central components of reliable microelectronic systems that m
 anage safety-critical applications operating in harsh environments\, inclu
 ding Space missions.\n \nIn Space missions\, integrated circuits face exac
 erbated reliability challenges\, primarily due to high radiation levels. W
 ith the growing demand for higher performance\, lower power consumption\, 
 and greater integration in emerging Space missions\, ensuring the reliabil
 ity of complex high-performance System-on-Chip (SoC) platforms is becoming
  increasingly challenging.\n \nThis talk presents the latest European deve
 lopments in designing reliable SoCs for Space missions. In addition\, it h
 ighlights the ESA Ultra Deep Submicron (UDSM) initiative. UDSM initiative 
 paves the way for the development of the next generation of fault-tolerant
  ASICs\, FPGAs\, and Microprocessors building blocks\, to accomplish highe
 r levels of integration and performance\, and to achieve technological sov
 ereignty.
LOCATION:SS03\, Computer Laboratory\, William Gates Building
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