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SUMMARY:Directional reflectance microscopy:  Beyond conventional crystal o
 rientation mapping - Matteo Seita\, Department of Engineering\, University
  of Cambridge
DTSTART:20260129T150000Z
DTEND:20260129T160000Z
UID:TALK242602@talks.cam.ac.uk
CONTACT:Malvina Constantinou
DESCRIPTION:Characterizing crystallographic orientation is essential for a
 ssessing structure-property relationships in crystalline solids. While dif
 fraction methods have dominated this field\, low throughput and high cost 
 limit their applicability to small\, specialized samples and restrict acce
 ss to premier research facilities. We present a complementary optical tech
 nique that expands applicability and broadens access. This technique—whi
 ch we call directional reflectance microscopy (DRM)—relies on acquiring 
 a series of optical micrographs of chemically etched crystalline materials
  under different illumination angles. Using image analysis to correlate th
 e directional reflectivity of the surface with the local etch-induced surf
 ace structure\, DRM enables previously impossible crystal orientation mapp
 ing of large-scale\, complex parts—such as entire multi-crystalline sili
 con solar cells\, turbine blades\, and complex parts produced by additive 
 manufacturing technology. The simplicity\, low cost\, and enhanced sample 
 throughput of our method promise to expand the availability of crystallogr
 aphic orientation mapping significantly\, making it readily available in e
 ducation as well as academic research and industrial settings.
LOCATION:Seminar Room West\, Room A0.015\, Ray Dolby Centre\, Cavendish La
 boratory
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