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SUMMARY:Cutting graphene with an AFM: device lithography in under a minute
  - Mr Philip Scard (Semiconductor Physics Group\, Cambridge)
DTSTART:20100531T131500Z
DTEND:20100531T141500Z
UID:TALK24777@talks.cam.ac.uk
CONTACT:afw24
DESCRIPTION:Graphene was first isolated six years ago\, and has since gene
 rated enormous interest due to its potential for electronics applications.
   It is intrinsically conducting\, with no band gap\, but may be\npatterne
 d to confine conduction\; room temperature transistor behaviour requires g
 raphene ribbons only a few nanometres wide\, at or beyond the limits of co
 nventional lithography and etching processes.  A potential alternative use
 s the sharp point of a scanning probe microscope to tailor the graphene fl
 ake. In this work a charged AFM tip has been used to cut patterns on few a
 nd single layer graphene\nwith feature sizes as small as 5 nm. In addition
  to these results\, this talk will present analysis used to derive a molec
 ular mechanism for the removal of carbon\, discussing in particular the ro
 le of water\nand an unstable solid carbon oxide. Thermal annealing also re
 vealed the presence of water beneath flakes\, which influences their trans
 port behaviour.
LOCATION:Mott Seminar Room
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