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SUMMARY:Characterisation of Materials Using Scanning Microwave Microscope 
 - Dr Fiona Frehill (Agilent Technologies Ltd\, UK)
DTSTART:20101217T160000Z
DTEND:20101217T170000Z
UID:TALK27678@talks.cam.ac.uk
CONTACT:3787
DESCRIPTION:Abstract not available
LOCATION:Centre for Advanced Photonics and Electronics\, 9\, JJ Thomson Av
 e.
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