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SUMMARY:Application of the Focused Ion Beam to Transport Measurements unde
 r High Pressure - Jakob Kanter\, ETH Zurich
DTSTART:20121031T111500Z
DTEND:20121031T121500Z
UID:TALK41279@talks.cam.ac.uk
CONTACT:Michael Sutherland
DESCRIPTION:Electronic transport measurements under high pressures face se
 veral experimental challenges due to confined sample space and high forces
  acting on contacts and leads. As a result conventional preparation method
 s are often limited in the number of possible leads and usually do not all
 ow for sample structuring. Hence transport measurements under high pressur
 es were often limited to four terminal measurements with one sample per an
 vil cell.\n\nThis talk will discuss the application of the focused ion bea
 m (FIB) technique to electronic transport measurements in anvil cells. The
  FIB enables sample contacting and structuring down to a sub-micrometre sc
 ale\, making the measurement of several samples with complex shapes on a s
 ingle anvil feasible. The advantages as well as possible drawbacks\, such 
 as FIB induced sample damage\, of this technique will be addressed. A shor
 t outlook on upcoming Shubnikov-de Haas measurements on the CePt2In7 heavy
  fermion system under pressure will be included.\n
LOCATION:Mott Seminar Room\, Cavendish Laboratory\, Department of Physics
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