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SUMMARY:The development of advanced TEM techniques for the characterisatio
 n of Pt catalyst nanoparticles - Lionel Cervera\, Department of Materials 
 Science and Metallurgy\, University of Cambridge
DTSTART:20060606T140000Z
DTEND:20060606T150000Z
UID:TALK4887@talks.cam.ac.uk
CONTACT:Edmund Ward
DESCRIPTION:Industrial catalysts usually comprise crystalline particles of
  high atomic number that have sizes of between 1 and 20 nm and are support
 ed or embedded in a lower atomic number matrix. Electron microscopy is an 
 important tool for the physical characterisation of their shapes\, sizes a
 nd crystalline structures\, which are\, in turn\, important for understand
 ing their catalytic properties. Here\, developments in transmission electr
 on microscopy (such as spherical aberration correctors) and in scanning tr
 ansmission electron microscopy (such as high-angle annular dark field elec
 tron tomography) are applied to the study of 5-15 nm platinum nanoparticle
 s supported on carbon. Indirect methods are also used to remove lens aberr
 ations using through-focal series exit-wavefunction restoration.
LOCATION:Austin Seminar Room\, Materials Science and Metallurgy\, Departme
 nt of
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