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SUMMARY:Spectrum Imaging: Challenges with Real Materials - Professor Alan 
 J Craven\, Department of Physics and Astronomy\, University of Glasgow
DTSTART:20060613T103000Z
DTEND:20060613T113000Z
UID:TALK4888@talks.cam.ac.uk
CONTACT:Edmund Ward
DESCRIPTION:There are many modern materials and devices where an understan
 ding of the structure\, composition and chemistry on the atomic scale is c
 rucial to achieving the performance sought from them.   The modern nanoana
 lytical electron microscope can record a range of analytical data (e.g. el
 ectron and x-ray spectra) at each pixel in an image with a spatial resolut
 ion approaching atomic size in a normal microscope and better than atomic 
 size in an aberration corrected microscope.   Thus we have the ability to 
 provide a great deal but not all the information sought.   Challenges are 
 presented when the are a wide range of atomic numbers present or when one 
 element is present in a low concentration.   Benefits come from the chemic
 al information present in the fine structure on ionisation edges.   A rang
 e of examples ranging from semiconductors to steels will be used to illust
 rate what is possible.
LOCATION:T001 [Tower Seminar Room]\, Materials Science and Metallurgy\, De
 partment of
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