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SUMMARY:Development of an advanced scanning transmission electron microsco
 pe for material science research - Dr Naoya Shibata\, Institute of Enginee
 ring Innovation\, University of Tokio
DTSTART:20140627T100000Z
DTEND:20140627T110000Z
UID:TALK52803@talks.cam.ac.uk
CONTACT:Caterina Ducati
DESCRIPTION:Understanding the atomic-scale structures of surfaces and inte
 rfaces is essential to control the functional properties of many materials
  and devices. Recent advances in aberration-corrected scanning transmissio
 n electron microscopy (STEM) have made possible the direct characterizatio
 n of localized atomic structures in materials\, especially at interfaces. 
 In STEM\, a finely focused electron probe is scanned across the specimen a
 nd the transmitted and/or scattered electrons from a localized volume of t
 he material are detected by the post-specimen detector(s) as a function of
  raster position. By controlling the detector geometry\, we gain flexibili
 ty in determining the contrast characteristics of the STEM images and the 
 formation mechanisms involved. Thus\, it may be possible to obtain further
  useful information by exploring new detector geometries in atomic-resolut
 ion STEM. \nRecently\, we have developed segmented type STEM detector cap
 able of atomic-resolution imaging and proposed new imaging possibilities b
 y controlling detector geometries: annular bright-field (ABF) imaging and 
 atomic-resolution differential phase contrast (DPC) imaging  ABF-STEM imag
 ing enables us to directly image light element atomic columns of materials
 . DPC-STEM imaging can be used to detect local electric fields even at ato
 mic dimensions. In this talk\, we will review our recent researches on the
  development of atomic-resolution STEM imaging techniques and some STEM ap
 plications to material interface characterization.
LOCATION:LT Goldsmith 1 Materials Science and Metallurgy\, Department of
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