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SUMMARY:Making the invisible visible: The nm scale perspective - Dr. Annie
  Loo\, Carl Zeiss Microscopy Ltd.\, Cambridge
DTSTART:20150423T173000Z
DTEND:20150423T190000Z
UID:TALK54059@talks.cam.ac.uk
CONTACT:Tim Wilkinson
DESCRIPTION:The scanning electron microscope (SEM) has been in use in vari
 ous applications including aircraft engine failure analysis\, medical\, mi
 ning\, electron beam nanolithography and semiconductor integrated circuit 
 inspection. This presentation outlines the operation of the scanning elect
 ron microscope\, innovations to date that enhance the capability of SEM in
  the various applications mentioned above\, example of organisations that 
 use SEM in their production process or R&D and the results that contribute
 d to our daily lives.\n\n\n
LOCATION:Lecture Theatre 0\, University of Cambridge Engineering Departmen
 t\, Trumpington Street\, Cambridge
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