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SUMMARY:Scanning instruments in the department - Iris Buisman\, Giulio Lam
 pronti\, Richard Harrison and Josh Einsle
DTSTART:20150130T110000Z
DTEND:20150130T120000Z
UID:TALK57224@talks.cam.ac.uk
CONTACT:Natalie Roberts
DESCRIPTION:A brief overview of the analysis techniques and applications o
 f the following instruments will be given:\n\n1) Electron Probe MicroAnaly
 zer (EPMA): provides quantitative microanalysis of solid samples. It is ca
 pable of high precision and accuracy down to ppm levels (for elements with
  atomic number ranging fluorine to uranium)\, and spatial resultion down t
 o micrometers. Non-destructive technique.\n\n2) Powder X-Ray Diffractomete
 r (PXRD): provides phase analysis of solid samples from identification to 
 quantification of crystal phases. It is a tool used for studying the atomi
 c and molecular arrangement in crystalline solids and how they change with
  variations in temperature\, pressure\, chemistry. Non-destructive techniq
 ue.\n\n3) Scanning Electron Microscope (SEM) with Quantitative Elemental M
 apping SCANner (QEMSCAN): a powerful high resolution imaging instrument\, 
 which uses several different detectors for different signals (Energy Dispe
 rsive Spectroscopy\, Secondary Electrons and BackScattered Electrons\, Cat
 hodoLuminescence\, Electron BackScattered Diffraction). QEMSCAN is a smart
  approach to EDS analysis. Non-destructive technique.\n\nPlease note there
  will also be a more detailed introduction to the new SEM and QEMSCAN inst
 rument to follow later in the term.\n\n4) Micro Magnetics MTJ Scanning Mag
 netic Microscope: this microscope enables us to map out of the remanent ma
 gnetic field of a polished thin section with ~nT field sensitivity and ~10
  µm spatial resolution\n\n5) Lakeshore VSM/AGM - The system combines both
  vibrating sample magnetometer (VSM) and alternating gradient field magnet
 ometer (AGM) options\, providing better flexibility in the range of sample
 s that can be measured. The instrument provides rapid magnetic characteris
 ation of natural samples\, primarily via hysteresis and first-order revers
 al curve (FORC) measurements.\n\n6) Agico MFK1 Kappa Bridge - This is a hi
 ghly sensitive instrument for measuring anisotropy of magnetic susceptibil
 ity and bulk magnetic susceptibility in weak variable magnetic fields (fie
 ld range from 2 A/m to 700 A/m\, peak values). Besides the in-phase bulk s
 usceptibility\, relative changes of the phase angle can be measured. \n\n7
 ) Josh Einsle will spend several minutes discussing the variety of instrum
 ents available to use through shared access to the the Electron Microscopy
  Suite in the Department of Materials Science and Metallurgy. Microscopes 
 and capabilities highlighted will include: \n\nHelios Nanolab SEM-FIB - Th
 is microscope system includes a focused ion beam (FIB) and scanning electr
 on microscope (SEM) on the same vacuum chamber. \n\nFEI Tecnai Orisis TEM/
 STEM 80-200 - The Osiris is a state-of-the-art analytical instrument desig
 ned for easy TEM imaging and fast chemical mapping in scanning transmissio
 n electron microscope (STEM) configuration using energy dispersive X-ray a
 nd electron energy loss spectroscopies (EDX and EELS). \n
LOCATION:Department of Earth Sciences - Harker I
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