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SUMMARY:Synchrotron radiation and beamlines at 3rd generation synchrotrons
  - Heribert Wilhelm\, Diamond Light Source Ltd.
DTSTART:20150302T153000Z
DTEND:20150302T163000Z
UID:TALK57687@talks.cam.ac.uk
CONTACT:Helen Verrechia
DESCRIPTION:The deviation of the refractive index from unity\, n=1- 
 in the X-ray regime is related to the scattering properties of the medium\
 , mainly the electron density. It will be shown that  is of the order o
 f 10-5 which implies that X-rays will be reflected externally for gracing 
 incident angles below a critical angle. This aspect is used to manufacture
  focussing devices for X-rays. These main components of a synchrotron beam
 line are able to focus X-rays down to a few tens of nanometre. Some exampl
 es are discussed as well as the principle of a monochromator\, another ind
 ispensable device for most experiments. The basics of how X-rays are gener
 ated by different insertion devices and how the characteristic parameters 
 of a synchrotron might set limits for an experiment are also discussed. Th
 is understanding is essential for many experiments to optimize the measure
 ment.
LOCATION:Mott Seminar Room (531)\, Cavendish Laboratory\, Department of Ph
 ysics
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