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SUMMARY:Pushing the limits of  analytical electron microscopy with data sc
 ience - Francisco de la Pena\, Electron Microscopy Group\, University of C
 ambridge
DTSTART:20160517T100000Z
DTEND:20160517T110000Z
UID:TALK64475@talks.cam.ac.uk
CONTACT:Duncan Johnstone
DESCRIPTION:Recent instrumentation advances are dramatically increasing th
 e amount and quality of data generated by modern scientific instruments\, 
 the electron microscope being no exception. Indeed\, in electron microscop
 y\,  multi-dimensional and multi-signal experiments are today becoming rou
 tine. In this context\, novel data analysis methods are posed to have a di
 sruptive role in shaping the immediate future of electron microscopy.\n\nT
 his seminar will discuss some advances in analytical electron microscopy e
 nabled by these developments including quantitative two and three-dimensio
 nal analysis of chemical elements\, bonding and surface plasmons at the na
 noscale. Software plays an increasingly important role in scientific innov
 ation. We will discuss how we are shaping HyperSpy\, a multi-dimensional d
 ata analysis software package\, to address some current challenges in the 
 analysis of electron microscopy datasets. 
LOCATION:LT Goldsmith 1 Materials Science and Metallurgy\, Department of
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