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SUMMARY:Unconventional Electron Microscopy - Vlad Stolojan\, Advanced Tech
 nology Institute\, University of Surrey\, Guildford
DTSTART:20070124T150000Z
DTEND:20070124T160000Z
UID:TALK6460@talks.cam.ac.uk
CONTACT:Nathan Church
DESCRIPTION:Unconvential electron microscopy refers to obtaining informati
 on beyond the normally accepted limitations of the microscope. One such ex
 ample presented here is energy loss spectroscopic profiling\, which allows
  sub-nanometre sampling resolution for the spectral information across lin
 ear features from a conventional instrument. Two illustrations will be pre
 sented: the dielectric nature of coatings on carbon nanotubes and the elec
 tronic properties of amorphous carbon superlattices. The other unconventio
 nal microscopy example shows how beam irradiation in the electron microsco
 pe can be exploited to extract essential information about the growth proc
 ess of carbon nanotubes from catalysts. We observe a controlled growth rev
 ersal in the electron microscope\; by studying the energetics of this proc
 ess\, we conclude that growth occurs via a surface-driven mechanism.
LOCATION:T001 [Tower Seminar Room]\, Materials Science and Metallurgy\, De
 partment of
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