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SUMMARY:Atomic-resolution studies of materials by aberration-corrected sca
 nning transmission electron microscopy - Ondrej L. Krivanek\, Nion Co. &am
 p\; Dept. of Physics\, Arizona State University
DTSTART:20160502T100000Z
DTEND:20160502T110000Z
UID:TALK65410@talks.cam.ac.uk
CONTACT:Duncan Johnstone
DESCRIPTION:Aberration-corrected scanning transmission electron  microscop
 es (STEMs) are now able to form intense electron probes as small as 0.5 Å
  in diameter\, and to image and spectroscopically analyze single atoms in-
 situ. Nion Co. has pioneered many of the underlying advances\, by developi
 ng the first electron-optical aberration corrector that improved the spati
 al resolution of electron microscopes beyond 1 Å\, and later by developin
 g a new STEM that can acquire images and spectra from single atoms in many
  different types of materials\, and to perform efficient atomic-resolution
  elemental mapping. More  recently\, we have introduced a monochromated ST
 EM system for electron energy loss spectroscopy(EELS)\, which has made vib
 rational spectroscopy possible at an energy resolution better than 10 meV\
 , and a spatial resolution of a few nm [1]. It has also allowed us to prob
 e biological samples with an aloof electron beam  parked in the vacuum a f
 ew tens of nm from the sample\, thus almost completely avoiding radiation 
 damage [2].\n\nThis seminar will review the basic principles behind  the n
 ew developments\, illustrate them with experimental results from a variety
  of 3D and 2D materials\, and discuss and illustrate especially inviting f
 uture directions.\n\n1. O.L. Krivanek et al.\, Nature\, 514\, 2014\, 209-2
 12\, see also Nature\, 514\, 2014\, 177-178.\n \n2. P. Rez et al.\, Nature
  Communications\, 7\, 2016\, article number 10945\, (doi:10.1038/ncomms109
 45).
LOCATION:Goldsmiths 1\, Lecture room\, Dept. of Materials Science and Meta
 llurgy
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