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SUMMARY:Electron Tomography - Challenges and Opportunities for 3D Nanoscal
 e Imaging and Analysis - Professor Paul Midgley (Materials Science and Met
 allurgy\, Cambridge)
DTSTART:20160406T090000Z
DTEND:20160406T100000Z
UID:TALK65504@talks.cam.ac.uk
CONTACT:Dr Christopher John Edgcombe
DESCRIPTION:Over the past 15 years or so\, materials-based electron tomogr
 aphy has evolved from a niche technique to one that is almost routine and 
 practised by most high-end electron microscopy labs. In this presentation 
 I will consider the progress made in that time\, focussing on the developm
 ent of STEM based electron tomography\, firstly in terms of the use and ap
 plication of HAADF 3D imaging and then to describe how this mode of tomogr
 aphy can be combined with EDX and EELS microanalysis and electron diffract
 ion to enable the mapping of not just morphology but composition\, optical
  and electronic properties and the local crystallography in 3D. I will als
 o consider how in recent years the reconstruction fidelity has improved gr
 eatly with the introduction of compressed sensing techniques that make use
  of prior information about the object being reconstructed. I will end wit
 h a short discussion about how we might reduce the time and/or dose needed
  for tomography so as to maximise the information content from the data ac
 quired.
LOCATION:Centre for Mathematical Sciences\, meeting room MR2
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