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SUMMARY:Using a new coincident XPS and Raman spectroscopy system for more 
 comprehensive carbon nanomaterials analysis  - Tim S. Nunney\, Thermo Fish
 er Scientific
DTSTART:20160720T150000Z
DTEND:20160720T160000Z
UID:TALK66874@talks.cam.ac.uk
CONTACT:Dr Stephen A. Hodge
DESCRIPTION:The potential uses of graphene are currently being explored by
  the materials science community. Its immediate potential as a transparent
  conductive electrode for the microelectronics industry is already being e
 xploited\; the unique combination of electronic\, chemical and structural 
 properties exhibited by graphene are already having a significant impact o
 n the development of thin film transistors and touch-screen devices. Furth
 er applications for the development of graphene-based catalytic systems an
 d molecular sensors are also underway. Good materials characterization is 
 required at all steps in the creation of new graphene devices\, from guidi
 ng the initial graphene synthesis and transfer to the desired substrate\, 
 to chemical modification and analysis of the finished device. In this pres
 entation we will show how a multi-technique approach using both Raman spec
 troscopy and XPS can address the challenges posed at these steps. These an
 alytical techniques deliver complementary information but until recently t
 his had to be collected using separate instruments. This makes true correl
 ative measurements from exactly the same position difficult\; necessitatin
 g additional software to match locations. By using a small form factor spe
 ctrometer\, engineered to interface with the XPS vacuum system\, data can 
 be collected from exactly the same position on the sample. In this present
 ation we will discuss the benefits of a combined approach\, illustrated wi
 th some applications examples\, to show how the combination of molecular s
 pectroscopy and surface analysis offers unique opportunities for materials
  analysis.\n
LOCATION:Cambridge Graphene Centre\, 9 JJ Thomson Avenue\, Cambridge CB3 O
 FA\, UK.
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