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SUMMARY:Computational Imaging in Atomic Force Microscopy - Thomas Arildsen
 \, Department of Electronic Systems\, Faculty of Engineering and Science\,
  Aalborg University\, Denmark
DTSTART:20160921T100000Z
DTEND:20160921T110000Z
UID:TALK67699@talks.cam.ac.uk
CONTACT:Duncan Johnstone
DESCRIPTION:Atomic force microscopy (AFM) is an imaging technique which ca
 n measure the surface structure of a specimen of interest down to nano-sca
 le. It does this by scanning a tiny probe across the surface somewhat like
  a record player pick-up and thereby measuring a "height map" or other pro
 perties of the surface.\n\nIn an ongoing research project at Aalborg Unive
 rsity we are attempting to speed up imaging or reduce interaction with the
  sample in AFM. We seek to achieve this by scanning the surface sparsely a
 nd thereby reducing the scan time and/or reducing the fraction of the surf
 ace area being affected by the probe. This naturally poses some challenges
  in the imaging process due to the resulting "missing data".\n\nIn this ta
 lk we explain how we use computational techniques inspired by compressed s
 ensing\, optimisation and inverse problems to reconstruct AFM images from 
 the otherwise insufficient measurements. We explain how we search for and 
 optimise sampling patterns to be better suited for subsequent reconstructi
 on of the images. We present some challenges met in the process of develop
 ing the proposed techniques from synthetic numerical experiments to real d
 ata from commercial AFM equipment and show examples of the results obtaine
 d so far.\n
LOCATION:Goldsmiths 2\, Lecture room\, Dept. of Materials Science and Meta
 llurgy
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