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SUMMARY:Analysing interfaces in multilayer films using STEM-EELS - David M
 cComb\, Imerial College London
DTSTART:20080226T150000Z
DTEND:20080226T160000Z
UID:TALK9925@talks.cam.ac.uk
CONTACT:Dr Jonathan Barnard
DESCRIPTION:In this presentation I will introduce the technique of\nscanni
 ng transmission electron microscopy electron energy loss spectroscopy (STE
 M-EELS) for analysis of multilayer thin films.  Using examples of high-k d
 ielectric stacks and ferroelectric superlattices I will show that STEM-EEL
 S enables us to probe the chemistry\, structure and bonding with high spat
 ial resolution.
LOCATION:T001 [Tower Seminar Room]\, Materials Science and Metallurgy\, De
 partment of
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