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The formation of contrast in scanning helium microscopy

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Over the last decade a new microscopy technique has emerged that uses neutral helium atoms as the probe particles. It has been termed scanning helium microscopy (SHeM), also known as neutral atom microscopy (NAM). SHeM produces helium atom micrographs by scanning the sample beneath a focused or collimated helium microprobe. As the technique is maturing, research efforts are moving on from the development of proof of concept instruments to the exploring of applications and optimising designs for the second generation of machine. In particular the mechanisms of contrast formation in SHeM are an active area of investigation.

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