Abstract

Reliability is crucial for ensuring safe operation and optimizing efficiency in safety-critical applications. Fault-tolerant integrated circuits are central components of reliable microelectronic systems that manage safety-critical applications operating in harsh environments, including Space missions.

In Space missions, integrated circuits face exacerbated reliability challenges, primarily due to high radiation levels. With the growing demand for higher performance, lower power consumption, and greater integration in emerging Space missions, ensuring the reliability of complex high-performance System-on-Chip (SoC) platforms is becoming increasingly challenging.

This talk presents the latest European developments in designing reliable SoCs for Space missions. In addition, it highlights the ESA Ultra Deep Submicron (UDSM) initiative. UDSM initiative paves the way for the development of the next generation of fault-tolerant ASI Cs, FPG As, and Microprocessors building blocks, to accomplish higher levels of integration and performance, and to achieve technological sovereignty.