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Lionel Cervera, Department of Materials Science and Metallurgy, University of Cambridge
Tuesday 06 June 2006, 15:00-16:00
The development of advanced TEM techniques for the characterisation of Pt catalyst nanoparticles
- đ¤ Speaker: Lionel Cervera, Department of Materials Science and Metallurgy, University of Cambridge
- đ Date & Time: Tuesday 06 June 2006, 15:00 - 16:00
- đ Venue: Austin Seminar Room, Materials Science and Metallurgy, Department of
Abstract
Industrial catalysts usually comprise crystalline particles of high atomic number that have sizes of between 1 and 20 nm and are supported or embedded in a lower atomic number matrix. Electron microscopy is an important tool for the physical characterisation of their shapes, sizes and crystalline structures, which are, in turn, important for understanding their catalytic properties. Here, developments in transmission electron microscopy (such as spherical aberration correctors) and in scanning transmission electron microscopy (such as high-angle annular dark field electron tomography) are applied to the study of 5-15 nm platinum nanoparticles supported on carbon. Indirect methods are also used to remove lens aberrations using through-focal series exit-wavefunction restoration.
Series This talk is part of the Electron Microscopy Group Seminars series.
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