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Thursday 23 April 2015, 18:30-20:00
Making the invisible visible: The nm scale perspective
â ī¸ Important: Tea is served from 6pm
- đ¤ Speaker: Dr. Annie Loo, Carl Zeiss Microscopy Ltd., Cambridge đ Website
- đ Date & Time: Thursday 23 April 2015, 18:30 - 20:00
- đ Venue: Lecture Theatre 0, University of Cambridge Engineering Department, Trumpington Street, Cambridge
Questions? Contact
Tim Wilkinson
Abstract
The scanning electron microscope (SEM) has been in use in various applications including aircraft engine failure analysis, medical, mining, electron beam nanolithography and semiconductor integrated circuit inspection. This presentation outlines the operation of the scanning electron microscope, innovations to date that enhance the capability of SEM in the various applications mentioned above, example of organisations that use SEM in their production process or R&D and the results that contributed to our daily lives.
Series This talk is part of the IET Cambridge Network - Lectures series.
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